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Predicting performance of object detection models in electron microscopy using random forests
Ni Li
,
Ryan Jacobs
,
Matthew Lynch
,
Vidit Agrawal
,
Kevin G Field
,
Dane Morgan
March 2025
Source Document
Type
Journal article
Publication
In: Digital Discovery, (4),
pp. 987–997
Related
Development and deployment of automated machine learning detection in electron microcopy experiments
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